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© 2005 Microchip Technology Inc. DS01019A-page 1
AN1019
BASIC TERMS
The definition of “endurance” (as applied to EEPROMs)
contains various words and phrases that require clear
definition and understanding. As shown in the following
paragraphs, different manufacturers use different
standards. “Endurance cycling” is a test performed by
all manufacturers (and some customers) to determine
how many “write cycles” the product will achieve before
failing.
Microchip defines “endurance” as the minimum
number of write cycles the product can be subjected to
before it fails.
“Failure” is a somewhat arbitrary definition since a
device only truly fails when it no longer meets the
customer expectation and does not operate in his
system. A failure can be defined in this, the loosest of
definitions, or the most stringent of definitions (whereby
a device would fail if it did not meet any of the data
sheet parameters), as well as a wide range in between.
For example, if the device does not correctly store data
into a particular address that is not used, then the
device would work correctly for the customer but would
fail a functional test by the manufacturer. Likewise, if
the device draws more current than the data sheet
specifies after some time, but the customer application
could supply the current needed, the device would
work in the customer application but would fail a
parametric test set by the manufacturer.
Microchip uses the most stringent definition:
A failure occurs when the device fails to meet any
data sheet condition under any specified operating
condition of a temperature and voltage.
The number of devices that can fail before a particular
endurance criteria is not met is also somewhat flexible.
Even the most quality-conscious manufacturer will
occasionally have a failure, so a failure level is defined.
There are several industry standard conditions for
many types of reliability tests. For example, IEEE-Std-
1005-1998 defines a maximum cumulative failure rate
of 1%. JEDEC (The Joint Electronic Device Engineer-
ing Council), JESD47, defines that if three lots of 77
units each have no fails (equivalent to an LTPD of 1%)
at a given endurance goal, then that goal has been
met.
Microchip uses a more stringent criteria for endurance:
No fails out of a sample of 256 units per product, and
no fails out of 3 lots of 256 units each per technology
for the given endurance goal to have been met. That is
equivalent to 0/768 or less than 0.3% LTPD.
A “write cycle” is also a somewhat flexible definition
since almost every customer will write the device in a
different way. For example, if the customer application
uses only the first three bytes of the array to store
variable data, and the remainder of the array is used as
a look-up table, then a write cycle will be complete
when the three data bytes have been re-written to their
new data state.
A write cycle is often described as an erase/write cycle
since almost all EEPROM technologies employ an
“auto-erase” before the data is actually written to the
array. This is also used by Microchip but we will use the
term “write cycle” since the auto-erase is invisible to,
and cannot be suppressed by, the customer.
The term “data changes” is occasionally used in place
of “write cycle” or “erase/write cycle.” A data change
will occur when an auto-erase cycle is initiated, and a
second data change will occur upon the write cycle,
therefore, an “erase/write cycle” is equivalent to two
“data changes.” The term “data change” may also imply
that a different type of cycling is being used than
“erase/write cycle”. This will be described later.
The term “write cycle” does not define under what
conditions the cycling was done (unless explicitly
stated), nor does it define the type of cycling that was
done. The endurance cycling can be done at any
number of conditions of voltage and temperature (e.g.,
85°C and 5.5V, or 25°C and 5.0V) that may or may not
meet with a customer’s application. The cycling mode
used in endurance cycling can affect the endurance of
the product. All these effects will be described later.
Microchip uses the most stringent conditions that are
reasonable for endurance cycling: Byte or Page mode
cycling at a temperature or 85°C at 5.5V. All data not
explicitly defined at other conditions is taken at these
conditions.
SYSTEM DESIGN CONSIDERATIONS
There are a number of design considerations that the
system designer can use to maximize the endurance of
an EEPROM-based device, if endurance is the
application’s limiting factor.
Author: David Wilkie
Microchip Technology Inc.
EEPROM Endurance Tutorial
Produktspecifikationer
| Varumärke: | Microchip |
| Kategori: | Inte kategoriserad |
| Modell: | 11AA02UID |
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